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IEEE Approved Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Pages: 157
Publication date: 2019-09-11
IEEE Guide for Evaluating and Testing the Electrical Performance of Energy Saving Devices
Pages: 46
Publication date: 2019-01-31
IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration
Pages: 54
Publication date: 2014-04-30
IEEE Standard for Terminology and Test Methods for Circuit Probes
Pages: 65
Publication date: 2014-02-14
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Pages: 388
Publication date: 2011-01-20
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
Pages: 195
Publication date: 2009-12-11
IEEE Trial-Use Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Instrument Descriptions
Pages: 228
Publication date: 2008-12-17
IEEE Standard for a Precision Clock Synchronization Protocol for Networked Measurement and Control Systems
Pages: 269
Publication date: 2008-07-24
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information
Pages: 35
Publication date: 2008-04-30
IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML (eXtensible Markup Language): Exchanging UUT (Unit Under Test) Description Information
Pages: 33
Publication date: 2008-03-28
