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IEEE 1505.1-2019

IEEE Approved Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

Pages: 157
Publication date: 2019-09-11
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Revision Standard - Active. This standard represents an extension to the IEEE 1505 receiver fixture interface (RFI) standard specification. Particular emphasis is placed on defining within the IEEE 1505 RFI standard a more specific set of performance requirements that employ a common scalable: (a) pin map configuration; (b) specific connector modules; (c) respective contacts; (d) recommended switching implementation; and (e) legacy automatic test equipment (ATE) transitional devices. This is intentionally done to standardize the footprint and assure mechanical and electrical interoperability between past and future automatic test systems (ATS).
Document identifier
IEEE 1505.1-2019
Title
IEEE Approved Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
IEEE Category
Instrument/Measurement/Testing, Test Instrumentation and Techniques
Publication date
2019-09-11
Status
Effective
International Relationship
Cross references
Latest version
IEEE 1505.1-2019
IEEE Approved Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
Document identifier IEEE 1505.1-2019
Publication date 2019-09-11
Classification
Status Effective
*
History of version
IEEE 1505.1-2019 * IEEE 1505.1-2008
Keywords
Classification
Pages
157
Price Contact

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