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IEEE Standard for Sensor Performance Parameter Definitions
Pages: 69
Publication date: 2014-08-12
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
Pages: 36
Publication date: 1991-12-13
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
Pages:
Publication date: 1991-10-17
IEEE Trial Use Standard Guide on Solid State Devices: Varactor Measurements Part 1- Small Signal Measurements
Pages: 20
Publication date: 1971-02-28
IEEE Standard Definitions on Electron Tubes
Pages: 30
Publication date: 1970-11-30
IRE Standards on Solid-State Devices: Definitions of Semiconductor Terms
Pages: 4
Publication date: 1960-10-31
IEEE Standards on Gas-Filled Radiation Counter Tubes: Methods of Testing, 1952
Pages: 7
Publication date: 1952-08-01
IEEE Recommended Practice for Voltage-Endurance Testing of Form-Wound Bars and Coils
Publication date: 1996-11-30
Pages: 18
Publication date: 1989-12-07
IEEE Standard Definitions, Symbols, and Characterization of Metal-Nitrite-Oxide Field-Effect Transistors
Pages: 44
Publication date: 1978-04-28