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IEEE 1620-2008

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

Pages: 26
Publication date: 2008-12-05
Price: 91 vnd

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Revision Standard - Active. This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization. Adopted by IEC as IEC 62860 Edition 1.0 2013-07.
Document identifier
IEEE 1620-2008
Title
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
IEEE Category
Nanotechnology
Publication date
2008-12-05
Status
Effective
International Relationship
Cross references
Latest version
IEEE 1620-2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Document identifier IEEE 1620-2008
Publication date 2008-12-05
Classification 31.080.30. Transistors
Status Effective
*
History of version
IEEE 1620-2008 * IEEE 1620-2004
Keywords
Classification
31.080.30. Transistors
Pages
26
Price 91 vnd

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