This document is designed to allow the user to assess, on a regular basis, several key parameters of an X-ray photoelectron spectrometer. It is not intended to provide an exhaustive performance check, but instead provides a rapid set of tests that can be conducted frequently.Aspects of instrument behaviour covered by this document include the vacuum, measurements of spectra of conductive or non-conductive test specimens and the current state of the X-ray source. Other important aspects of the instrument performance (e.g. lateral resolution) fall outside the scope of this document.The document is intended for use with commercial X-ray photoelectron spectrometers equipped with a monochromated Al Kα X-ray source or with an unmonochromated Al or Mg Kα X-ray source.
Document identifier
ISO 16129:2018
Title
Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO Category
TC 201/SC 7: X-ray photoelectron spectroscopy
Publication date
2018-11-01
International Relationship
BS ISO 16129:2018
History of version
ISO 16129:2018 * ISO 16129:2012
Price |
103 vnd |