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IEC 62884-3 Ed. 1.0 b:2018

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

Pages: 26
Publication date: 2018-03-22
Price: 82 vnd

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IEC 62884-3:2018 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.
Document identifier
IEC 62884-3 Ed. 1.0 b:2018
Title
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
IEC Category
TC 49: Piezoelectric and dielectric devices for frequency control and selection
Publication date
2018-03-22
Status
Effective
International Relationship
Cross references
Latest version
IEC 62884-3 Ed. 1.0 b:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
Document identifier IEC 62884-3 Ed. 1.0 b:2018
Publication date 2018-03-22
Classification 31.140. Piezoelectric devices
Status Effective
*
History of version
IEC 62884-3 Ed. 1.0 b:2018 * IEC 62884-3 Ed. 1.0 en:2018
Keywords
Classification
31.140. Piezoelectric devices
Pages
26
Price 82 vnd

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