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IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

Pages: 64
Publication date: 2017-01-27
Price: 77 vnd

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Revision Standard - Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.
Document identifier
IEEE 1445-2016
Title
IEEE Standard for Digital Test Interchange Format (DTIF)
IEEE Category
General Interests, Test Instrumentation and Techniques
Publication date
2017-01-27
Status
Effective
International Relationship
Cross references
Latest version
IEEE 1445-2016
IEEE Standard for Digital Test Interchange Format (DTIF)
Document identifier IEEE 1445-2016
Publication date 2017-01-27
Classification 35.080. Software
Status Effective
*
History of version
IEEE 1445-2016 * IEEE 1445-1998
Keywords
Classification
35.080. Software
Pages
64
Price 77 vnd

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