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IEC 60749-12 Ed. 2.0 b:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Pages: 14
Publication date: 2017-12-13
Price: 23 vnd

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IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packagesThis second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision.A This edition includes the following significant technical changes with respect to the previous edition:a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
Document identifier
IEC 60749-12 Ed. 2.0 b:2017
Title
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
IEC Category
TC 47: Semiconductor devices
Publication date
2017-12-13
Status
Effective
International Relationship
Cross references
Latest version
IEC 60749-12 Ed. 2.0 b:2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Document identifier IEC 60749-12 Ed. 2.0 b:2017
Publication date 2017-12-13
Classification 31.080.01. Semiconductor devices in general
Status Effective
*
History of version
IEC 60749-12 Ed. 2.0 b:2017 * IEC 60749-12 Ed. 1.0 b:2002
Keywords
Classification
31.080.01. Semiconductor devices in general
Pages
14
Price 23 vnd

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