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ASTM E2444-11(2018)

Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films

Pages: 2
Publication date: 2018-05-01
Price: 42 vnd

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1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section 2, which were generated by Committee E08 on Fatigue and Fracture. Terminology E1823 Relating to Fatigue and Fracture Testing is applicable to this standard. 1.2 The terms are listed in alphabetical order. 1.3 This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Document identifier
ASTM E2444-11(2018)
Title
Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
ASTM Category
Publication date
2018-05-01
Status
Effective
International Relationship
Cross references
Latest version
ASTM E2444-11(2018)
Standard Terminology Relating to Measurements Taken on Thin, Reflecting Films
Document identifier ASTM E2444-11(2018)
Publication date 2018-05-01
Classification 01.040.31. Electronics (Vocabularies)
31.240. Mechanical structures for electronic equipment
Status Effective
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History of version
ASTM E2444-11(2018) * ASTM E2444-11e1 * ASTM E2444-11 * ASTM E2444-05e1 * ASTM E2444-05
Keywords
Pages
2
Price 42 vnd