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ISO 22493:2008

Microbeam analysis - Scanning electron microscopy - Vocabulary

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Publication date: 2008-10-01
Price: 139 vnd

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ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
Document identifier
ISO 22493:2008
Title
Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO Category
TC 202/SC 1: Terminology
Publication date
2008-10-01
Status
Ineffective
International Relationship
BS ISO 22493:2008 * BS ISO 22493:2008
Cross references
Latest version
ISO 22493:2014
Microbeam analysis - Scanning electron microscopy - Vocabulary
Document identifier ISO 22493:2014
Publication date 2014-04-15
Classification 01.040.37. Image technology (Vocabularies)
37.020. Optical equipment
Status Effective
*
History of version
ISO 22493:2014*ISO 22493:2008 * ISO 22493:2014 * ISO 22493:2008
Keywords
Classification
01.040.37. Image technology (Vocabularies)
37.020. Optical equipment
Pages
Price 139 vnd

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