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ISO 22493:2014

Microbeam analysis - Scanning electron microscopy - Vocabulary

Pages: 28
Publication date: 2014-04-15
Price: 138 vnd

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ISO 22493:2014 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.ISO 22493:2014is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of ISO 22493:2014 are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.
Document identifier
ISO 22493:2014
Title
Microbeam analysis - Scanning electron microscopy - Vocabulary
ISO Category
TC 202/SC 1: Terminology
Publication date
2014-04-15
Status
Effective
International Relationship
BS ISO 22493:2014
Cross references
Latest version
ISO 22493:2014
Microbeam analysis - Scanning electron microscopy - Vocabulary
Document identifier ISO 22493:2014
Publication date 2014-04-15
Classification 01.040.37. Image technology (Vocabularies)
37.020. Optical equipment
Status Effective
*
History of version
ISO 22493:2014 * ISO 22493:2008
Keywords
Classification
01.040.37. Image technology (Vocabularies)
37.020. Optical equipment
Pages
28
Price 138 vnd

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