This standard describes a nondestructive test to assess solid state device mark legibility. The specification applies only to solid state devices that contain markings, regardless of the marking method. It does not define what devices must be marked or the method in which the device is marked, i.e., ink, laser, etc. The standard is limited in scope to the legibility requirements of solid state devices, and does not replace related reference documents listed in this standard.
Document identifier
JEDEC JESD22-B114B
JEDEC Category
JC-14.3: Silicon Devices Reliability Qualification and Monitoring
Publication date
2020-01-01
International Relationship
History of version
JEDEC JESD22-B114B * JEDEC JESD22-B114A * JEDEC JESD 22-B114
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56 vnd |
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