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IEEE 1445-1998

IEEE Standard for Digital Test Interchange Format (DTIF)

Pages: 108
Publication date: 1999-03-10
Price: 121 vnd

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New IEEE Standard - Superseded. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are deA?ned. This information can be broadly grouped into data that deA?nes the following: UUT Model, Stimulus and Response, Fault Dictionary, and Probe.
Document identifier
IEEE 1445-1998
Title
IEEE Standard for Digital Test Interchange Format (DTIF)
IEEE Category
General Interests
Publication date
1999-03-10
Status
Ineffective
International Relationship
Cross references
Latest version
IEEE 1445-2016
IEEE Standard for Digital Test Interchange Format (DTIF)
Document identifier IEEE 1445-2016
Publication date 2017-01-27
Classification 35.080. Software
Status Effective
*
History of version
IEEE 1445-2016*IEEE 1445-1998 * IEEE 1445-2016 * IEEE 1445-1998
Keywords
Classification
35.080. Software
Pages
108
Price 121 vnd

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