Loading data. Please wait

Search standard  
Advanced search

IEC 60749-18 Ed. 2.0 b:2019

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Pages: 44
Publication date: 2019-04-10
Price: 164 vnd

Add to cart
IEC 60749-18 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.
Document identifier
IEC 60749-18 Ed. 2.0 b:2019
Title
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
IEC Category
TC 47: Semiconductor devices
Publication date
2019-04-10
Status
Effective
International Relationship
Cross references
Latest version
IEC 60749-18 Ed. 2.0 b:2019
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
Document identifier IEC 60749-18 Ed. 2.0 b:2019
Publication date 2019-04-10
Classification 31.080.01. Semiconductor devices in general
Status Effective
*
History of version
IEC 60749-18 Ed. 2.0 b:2019 * IEC 60749-18 Ed. 1.0 b:2002
Keywords
Classification
31.080.01. Semiconductor devices in general
Pages
44
Price 164 vnd

POPULAR PUBLISHERS | ALL PUBLISHERS