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IEEE 1149.1-2013

IEEE Standard for Test Access Port and Boundary-Scan Architecture

Pages: 442
Publication date: 2013-05-13
Price: 296 vnd

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Revision Standard - Active. Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry includes a standard interface through which instructions and test data are communicated. A set of test features is defined, including a boundary-scan register, such that the component is able to respond to a minimum set of instructions designed to assist with testing of assembled printed circuit boards. Also, a language is defined that allows rigorous structural description of the component-specific aspects of such testability features, and a second language is defined that allows rigorous procedural description of how the testability features may be used.
Document identifier
IEEE 1149.1-2013
Title
IEEE Standard for Test Access Port and Boundary-Scan Architecture
IEEE Category
Test Technology
Publication date
2013-05-13
Status
Effective
International Relationship
Cross references
Latest version
IEEE 1149.1-2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
Document identifier IEEE 1149.1-2013
Publication date 2013-05-13
Classification 31.180. Printed circuits and boards
31.200. Integrated circuits. Microelectronics
Status Effective
*
History of version
IEEE 1149.1-2013 * IEEE 1149.1-2001 * IEEE 1149.1-1990
Keywords
Pages
442
Price 296 vnd