New IEEE Standard - Active.
The standard formalizes aspects of fault models as they are relevant to the generation of test patterns for digital circuits. Its scope includes (i) fault counting, (ii) fault classification, and (iii) fault coverage reporting across different ATPG (automatic test pattern generation) tools, for the single stuck-at fault model. With this standard, it shall be incumbent on all ATPG tools (which comply with this standard) to report fault coverage in a uniform way. This will facilitate the generation of a uniform coverage (and hence a uniform test quality) metric for large chips (including systems-on-chips ¿¿¿ SOCs) with different cores and modules, for which test patterns have been independently generated.
Document identifier
IEEE 1804-2017
Title
IEEE Standard for Fault Accounting and Coverage Reporting(FACR) for Digital Modules
IEEE Category
Test Technology
Publication date
2018-01-31
International Relationship
| Price |
53 vnd |
.jpg){kind=logo}
---Logo.jpg){kind=logo}
.jpg){kind=logo}
-_-logo.png){kind=logo}
.jpg){kind=logo}
.png)
