New IEEE Standard - Superseded.
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described, togetherwith the means of control of and access to both analog and digital test data. Sample implementationand application details (which are not part of the standard) are included for illustration. "
Document identifier
IEEE 1149.4-1999
Title
IEEE Standard for a Mixed-Signal Test Bus
IEEE Category
Computer Hardware/Design and Test
Publication date
2000-03-20
International Relationship
History of version
IEEE 1149.4-2010*IEEE 1149.4-1999 * IEEE 1149.4-2010 * IEEE 1149.4-1999
Price |
104 vnd |