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IEC 63150-1 Ed. 1.0 b:2019

Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations

Pages: 74
Publication date: 2019-05-10
Price: 235 vnd

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IEC 63150-1:2019 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range.
Document identifier
IEC 63150-1 Ed. 1.0 b:2019
Title
Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations
IEC Category
TC 47: Semiconductor devices
Publication date
2019-05-10
Status
Effective
International Relationship
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Keywords
Pages
74
Price 235 vnd