ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.
Document identifier
ISO 18116:2005
Title
Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis
ISO Category
TC 201/SC 2: General procedures
Publication date
2005-08-15
International Relationship
BS ISO 18116:2005 * BS ISO 18116:2005
| Price |
103 vnd |
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