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IEC 62047-30 Ed. 1.0 en:2017

Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film

Pages: 20
Publication date: 2017-09-15
Price: 117 vnd

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IEC 62047-30:2017(E) specifies measuring methods of electro-mechanical conversion characteristics of piezoelectric thin film used for micro sensors and micro actuators, and its reporting schema to determine the characteristic parameters for consumer, industry or any other applications of piezoelectric devices. This document applies to piezoelectric thin films fabricated by MEMS process
Document identifier
IEC 62047-30 Ed. 1.0 en:2017
Title
Semiconductor devices - Micro-electromechanical devices - Part 30: Measurement methods of electro-mechanical conversion characteristics of MEMS piezoelectric thin film
IEC Category
SC 47F: Micro-electromechanical systems
Publication date
2017-09-15
Status
Effective
International Relationship
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Pages
20
Price 117 vnd