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Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Pages: 23
Publication date: 2004-05-15
Price: 149 vnd
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials | |
Document identifier | ISO 18118:2015 |
Publication date | 2015-04-01 |
Classification | 71.040.40. Chemical analysis |
Status | Effective |