ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
Document identifier
ISO 24173:2009
Title
Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO Category
TC 202: Microbeam analysis
Publication date
2009-09-01
International Relationship
BS ISO 24173:2009 * BS ISO 24173:2009
| Price |
185 vnd |
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