Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Document identifier
IEC 62526 Ed. 1.0 en:2007
Title
Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
IEC Category
TC 91: Electronics assembly technology, TC 93: Design automation
Publication date
2007-11-07
International Relationship
| Price |
387 vnd |
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