IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
Document identifier
IEC 62215-3 Ed. 1.0 b:2013
Title
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
IEC Category
SC 47A: Integrated circuits
Publication date
2013-07-17
International Relationship
| Price |
235 vnd |
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