This standard is intended to identify a core set of qualification tests that apply specifically for Power Amplifier Modules and their primary application in mobile devices such as cellular phones. This standard is intended to describe specific stresses and failure mechanisms that are specific to compound semiconductors and power amplifier modules. It is intended to establish more meaningful and efficient qualification testing.
Document identifier
JEDEC JESD237
Title
Reliability Qualification of Power Amplifier Modules
JEDEC Category
JC-42.4: Non-Volatile Memory Devices
Publication date
2014-03-01
International Relationship
| Price |
67 vnd |
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