The purpose of this document provides the basis for the optimization of 100% screening/stress operations and sample inspection test activities. This document is designed to assist the manufacturer in optimizing the test flow while maintaining and/or improving assurance of providing high quality and reliable product in an efficient manner. This will allow for optimization of testing that is not adding value, hence, reducing cycle time and costs.
Document identifier
JEDEC JEP121A
Title
REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION
JEDEC Category
JC-13.2: Microelectronic Devices
Publication date
2006-10-01
International Relationship
| Price |
76 vnd |
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