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IEEE 1450-1999

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Pages: 140
Publication date: 1999-09-01
Price: 344 vnd

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New IEEE Standard - Active. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Document identifier
IEEE 1450-1999
Title
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data
IEEE Category
Computer Engineering
Publication date
1999-09-01
Status
Effective
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Pages
140
Price 344 vnd