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ISO 16526-1:2011

Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider method

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Publication date: 2011-12-15
Price: 45 vnd

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ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
Document identifier
ISO 16526-1:2011
Title
Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider method
ISO Category
TC 135/SC 5: Radiation methods
Publication date
2011-12-15
Status
Effective
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Price 45 vnd