STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
Document identifier
IEC 62527 Ed. 1.0 en:2007
Title
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
IEC Category
TC 91: Electronics assembly technology, TC 93: Design automation
Publication date
2007-11-07
International Relationship
| Price |
235 vnd |
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