ISO 21222:2020 describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.
Document identifier
ISO 21222:2020
Title
Surface chemical analysis - Scanning probe microscopy - Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
ISO Category
TC 201/SC 9: Scanning probe microscopy
Publication date
2020-02-01
International Relationship
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103 vnd |
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