ISO 21859:2019 specifies a test method for plasma resistance of ceramic components in semiconductor manufacturing equipment. It is applicable to ceramic components of plasma-resistant components in dry etching chambers used in semiconductor manufacturing.
Document identifier
ISO 21859:2019
Title
Fine ceramics (advanced ceramics, advanced technical ceramics) - Test method for plasma resistance of ceramic components in semiconductor manufacturing equipment
ISO Category
TC 206: Fine ceramics
Publication date
2019-07-01
International Relationship
BS ISO 21859:2019
Price |
45 vnd |