ISO 21270:2004 specifies two methods for determining the maximum count rate for an acceptable limit of divergence from linearity of the intensity scale of Auger and X-ray photoelectron spectrometers. It also includes methods to correct for intensity non-linearities so that a higher maximum count rate can be employed for those spectrometers for which the relevant correction equations have been shown to be valid.
Document identifier
ISO 21270:2004
Title
Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO Category
TC 201/SC 7: X-ray photoelectron spectroscopy
Publication date
2004-06-01
International Relationship
BS ISO 21270:2004 * BS ISO 21270:2004
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103 vnd |
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