Loading data. Please wait

JEDEC JEP151

, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices

Pages: 24
Publication date: 2015-12-01
Price: 62 vnd

Add to cart
This test method defines the requirements and procedures for terrestrial destructive* single-event effects (SEE) for example, single-event breakdown (SEB), single-event latch-up (SEL) and single-event gate rupture (SEGR) testing . It is valid when using an accelerator, generating a nucleon beam of either; 1) Mono-energetic protons or mono-energetic neutrons of at least 150 MeV energy, or 2) Neutrons from a spallation spectrum with maximum energy of at least 150 MeV. This test method does not apply to testing that uses beams with particles heavier than protons.
Document identifier
JEDEC JEP151
Title
, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
JEDEC Category
JC-14: Quality and Reliability of Solid State Products
Publication date
2015-12-01
Status
Effective
International Relationship
Cross references
Latest version
History of version
Keywords
Classification
Pages
24
Price 62 vnd