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ISO 15632:2002

Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

Pages: 8
Publication date: 2002-12-01
Price: 70 vnd

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ISO 15632 defines the most important quantities that characterize an energy dispersive X-ray spectrometer (EDS) consisting of a semiconductor detector, a pre-amplifier and a signal processing unit as the essential parts. This International Standard is only applicable to spectrometers with semiconductor detectors operating on the principle of solid state ionization. It specifies minimum requirements for such spectrometers attached to an electron probe microanalyser (EPMA) or a scanning electron microscope (SEM). Realization of the analysis is outside the scope of this International Standard.
Document identifier
ISO 15632:2002
Title
Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
ISO Category
TC 202: Microbeam analysis
Publication date
2002-12-01
Status
Ineffective
International Relationship
BS ISO 15632:2002
Cross references
Latest version
ISO 15632:2012
Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Document identifier ISO 15632:2012
Publication date 2012-08-01
Classification 71.040.99. Other standards related to analytical chemistry
Status Effective
*
History of version
ISO 15632:2012*ISO 15632:2002 * ISO 15632:2012 * ISO 15632:2002
Keywords
Classification
71.040.99. Other standards related to analytical chemistry
37.020. Optical equipment
Pages
8
Price 70 vnd

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