ISO 18117:2009 gives guidance on the handling of and the containers for specimens submitted for surface chemical analysis. It is intended for the user of surface analysis services as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly the following: Auger electron spectroscopy (AES), secondary-ion mass spectrometry (SIMS) and X-ray photoelectron spectroscopy (XPS or ESCA). The protocols presented may also be applicable to other analytical techniques, such as TXRF, that are sensitive to surface composition. In particular instances, with particular specimens, further precautions may be necessary.
Document identifier
ISO 18117:2009
Title
Surface chemical analysis - Handling of specimens prior to analysis
ISO Category
TC 201/SC 2: General procedures
Publication date
2009-03-15
International Relationship
BS ISO 18117:2009 * BS ISO 18117:2009
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