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IEC 62884-2 Ed. 1.0 en:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Pages: 24
Publication date: 2017-08-30
Price: 164 vnd

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IEC 62884-2:2017(E) specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.NOTE - Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.
Document identifier
IEC 62884-2 Ed. 1.0 en:2017
Title
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
IEC Category
TC 49: Piezoelectric and dielectric devices for frequency control and selection
Publication date
2017-08-30
Status
Ineffective
International Relationship
Cross references
Latest version
IEC 62884-2 Ed. 1.0 b:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
Document identifier IEC 62884-2 Ed. 1.0 b:2017
Publication date 2017-08-30
Classification 31.140. Piezoelectric devices
Status Effective
*
History of version
IEC 62884-2 Ed. 1.0 b:2017*IEC 62884-2 Ed. 1.0 en:2017 * IEC 62884-2 Ed. 1.0 b:2017 * IEC 62884-2 Ed. 1.0 en:2017
Keywords
Classification
31.140. Piezoelectric devices
Pages
24
Price 164 vnd

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