ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X-ray photoelectron spectroscopy (XPS). It includes information that is to be recorded on or in the analytical record.
Document identifier
ISO 16243:2011
Title
Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO Category
TC 201/SC 2: General procedures
Publication date
2011-12-01
International Relationship
BS ISO 16243:2011 * BS ISO 16243:2011
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68 vnd |
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