This publication describes guidelines for applying JEDEC reliability tests and recommended testing procedures to integrated circuits that require adapter test boards for electrical and reliability testing. These tests are used frequently in qualifying integrated circuits as a new product, a product family, or as products in a process which is being changed.
Document identifier
JEDEC JEP176
Title
ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES
JEDEC Category
JC-64: Embedded Memory Storage and Removable Memory Cards
Publication date
2018-01-01
International Relationship
| Price |
62 vnd |
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