The purpose of this white paper will be to introduce a new perspective about EOS to the electronics industry. As failures exhibiting EOS damage are commonly experienced in the industry, and these severe overstress events are a factor in the damage of many products, the intent of the white paper is to clarify what EOS really is and how it can be mitigated once it is properly comprehended.
Document identifier
JEDEC JEP174
Title
UNDERSTANDING ELECTRICAL OVERSTRESS - EOS
JEDEC Category
JC-64: Embedded Memory Storage and Removable Memory Cards
Publication date
2016-09-01
International Relationship
Price |
208 vnd |